Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films that possess stratification of scatterers vertically within a sample, it can be difficult to determine where those scatterers are positioned. We present an in-situ method to extract film thickness, the index of refraction, and depth information using scattering images taken across a range of incident angles. The underlying theory is presented, and we validate the technique using two sets of polymer thin films. Finally, we discuss how it can be implemented as a general beamline procedure. This technique is applicable to any thin-film material and has potentially far-reaching impact by enabling depth-sensitive information in situ at any grazing incidence-capable beamline.
- Pub Date:
- July 2019
- Physics - Applied Physics;
- Condensed Matter - Soft Condensed Matter;
- Physics - Optics
- 8 pages, 8 figures Revision Comments: The title has been changed to reflect the expanded scope of the revised manuscript. Theoretical background for the technique has been expanded. Data analysis for the single layer films was re-done, using updated beam divergence and energy resolution values. Finally, an additional section on bi-layer films has been added