Ptychographic X-ray computed tomography at a high-brilliance X-ray source Sala, Simone ; Batey, Darren J. ; Prakash, Anupama ; Ahmed, Sharif ; Rau, Christoph ; Thibault, Pierre Abstract Publication: Optics Express Pub Date: January 2019 DOI: 10.1364/OE.27.000533 Bibcode: 2019OExpr..27..533S