Microscopy investigation of conical and layered nanowires
Abstract
This article discusses the use of scanning microscopy in the study of one-dimensional nanostructures - nanowires. The nanowires were produced by matrix synthesis. Atomic force microscopy (AFM) of conical nanowires was carried out, and layered nanowires were investigated by AFM and magnetic force microscopy (MFM) methods.
- Publication:
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Materials Science and Engineering Conference Series
- Pub Date:
- December 2019
- DOI:
- 10.1088/1757-899X/699/1/012005
- Bibcode:
- 2019MS&E..699a2005C