A 50 ps resolution monolithic active pixel sensor without internal gain in SiGe BiCMOS technology
Abstract
A monolithic pixelated silicon detector designed for high time resolution has been produced in the SG13G2 130 nm SiGe BiCMOS technology of IHP. This proof-of-concept chip contains hexagonal pixels of 65 μm and 130 μm side. The SiGe front-end electronics implemented provides an equivalent noise charge of 90 and 160 e- for a pixel capacitance of 70 and 220 fF, respectively, and a total time walk of less than 1 ns. Lab measurements with a 90Sr source show a time resolution of the order of 50 ps. This result is competitive with silicon technologies that integrate an avalanche gain mechanism.
- Publication:
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Journal of Instrumentation
- Pub Date:
- November 2019
- DOI:
- arXiv:
- arXiv:1908.09709
- Bibcode:
- 2019JInst..14P1008I
- Keywords:
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- Physics - Instrumentation and Detectors
- E-Print:
- doi:10.1088/1748-0221/14/11/P11008