Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA
Abstract
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- July 2019
- DOI:
- 10.1109/TNS.2019.2921796
- Bibcode:
- 2019ITNS...66.1433B