Reliable Mobility Evaluation of Organic Field-Effect Transistors With Different Contact Metals Huang, Fanming ; Liu, Ao ; Zhu, Huihui ; Xu, Yong ; Balestra, Francis ; Ghibaudo, Gerard ; Noh, Yong-Young ; Chu, Junhao ; Li, Wenwu Abstract Publication: IEEE Electron Device Letters Pub Date: April 2019 DOI: 10.1109/LED.2019.2901315 Bibcode: 2019IEDL...40..605H