Investigation of Threshold Voltage Distribution Temperature Dependence in 3D NAND Flash Zhao, Chenglin ; Jin, Lei ; Li, Da ; Xu, Feng ; Zou, Xingqi ; Zhang, Yu ; Song, Yali ; Wei, Huazheng ; Chen, Yi ; Li, Chunlong ; Huo, Zongliang Abstract Publication: IEEE Electron Device Letters Pub Date: February 2019 DOI: 10.1109/LED.2018.2886345 Bibcode: 2019IEDL...40..204Z