The primary mirror (M1) of Thirty Meter Telescope (TMT) consists of 492 segments of which, 86 are ground and polished by India-TMT. These segments are off-axis and aspheric in nature and one of the effective methods to polish such segments is through Stressed Mirror Polishing (SMP). During SMP, consistent in-situ metrology of the surface is needed to achieve the required profile. A 2D Profilometer (2DP) will be used by India-TMT for the low frequency profile metrology. The 2DP is a contact-approach metrology, consisting of probes positioned in a spiral pattern, measuring the sag of segment surface. Initial section of this paper deals with the sensitivity and tolerance analysis of the 2DP. This is followed by the study on position and rotational errors of the 2DP as a whole. Simulation of these analysis is carried out initially on a sphere and then on different segments of the TMT, in order to study the induced measurement errors.