Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography
Abstract
- Publication:
-
Nano Letters
- Pub Date:
- February 2018
- DOI:
- 10.1021/acs.nanolett.7b04024
- Bibcode:
- 2018NanoL..18..811H