Study of Helium-Ion-Beam-Generated Defects in a Monolayer WS2 Using Aberration-Corrected Scanning Transmission Electron Microscopy
Abstract
- Publication:
-
Microscopy and Microanalysis
- Pub Date:
- August 2018
- DOI:
- 10.1017/S1431927618008462
- Bibcode:
- 2018MiMic..24S1596K