Development and validation of a multi-dimensional measure of intellectual humility Alfano, Mark ; Iurino, Kathryn ; Stey, Paul ; Robinson, Brian ; Christen, Markus ; Yu, Feng ; Lapsley, Daniel Abstract Publication: PLoS ONE Pub Date: August 2017 DOI: 10.1371/journal.pone.0182950 Bibcode: 2017PLoSO..1282950A