X-ray synchrotron dual energy imaging for material specific study
Abstract
X-ray imaging techniques, in general, are used to study the internal structures of an object non-destructively such as anatomy, imperfections, cracks and voids whereas insensitive to spatial distribution of different element or elemental compositions of the object. With the development of advance bright X-ray synchrotron sources and accurate energy tunability using high resolution crystal monochromator, detection of elemental distribution in an object became possible. Quantitative small concentrations with enhance contrast can be detected fast in X-ray synchrotron based dual energy imaging, in comparison to conventional X-ray lab based techniques. We report here the experimental setup, image acquisition and image processing for the dual energy X-ray imaging (DEI) technique to retrieve the spatial distribution of different elements in the object.
- Publication:
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Dae Solid State Physics Symposium 2016
- Pub Date:
- May 2017
- DOI:
- Bibcode:
- 2017AIPC.1832f0010S