The Competing Influences of the Radiation Belts on the Charging of Extremely Resistive Spacecraft Materials

Spacecraft suffer from various types of anomalies caused by space weather. One important source of spacecraft anomalies is internal electrostatic discharge (IESD), which occurs when penetrating electrons deposit charge inside dielectrics faster than that charge can dissipate via conduction currents. This causes the electric field to build up to a breakdown threshold. The most electrically resistive materials, such as Teflon, are of greatest concern for IESD. Laboratory measurements of the conductivity of Teflon and other highly resistive polymers show that their conventional conductivity is negligible in comparison to their radiation-induced conductivity (RIC), an alternate source of conduction that is linearly proportional to the ionizing dose rate received by the material. The space radiation environment therefore plays contradictory roles in extremely resistive polymers, both depositing charge and dissipating it. The spectral shape, rather than the total electron flux, becomes the primary consideration for IESD because it determines the relative deposition of charge and ionizing dose in materials. A counterintuitive result is that soft spectra may be a greater risk for IESD, because relative to hard spectra they deposit more charge than dose in materials. This differs from the standard practice of defining the worst-possible environment for charging and IESD as the spectrum in which the electron flux is highest at all energies that could reach the material. We present analyses of CRRES MEA and HEEF measurements, and simulate the charging of material samples from the CRRES Internal Discharge Monitor. We briefly demonstrate the unexpected results described here, and quantify the effect of different energetic electron spectra observed by CRRES on the buildup of charge in Teflon samples from the Internal Discharge Monitor. Finally, we will comment on the perceived deficiency of "worst case" charging environments for predicting IESD, and how we can better quantify IESD risk in extremely resistive materials.