Transverse xray scattering on random rough surfaces
Abstract
This paper presents a new method to model the transverse scattering from random rough surfaces. It uses the same approach as our 2003 SPIE paper  PZ and LVS,^{1} but considers the scattering in the direction perpendicular to the incident plane. For a given Power Spectral Density, a model surface is constructed by assigning a random phase to each spectral component. The incident wave is reflected from the model rough surface and then projected to an outgoing wavefront, which is then redistributed onto an even grid in the transverse direction, with corrections for the wave densities and the phase shifts. Fast Fourier transforms are used to calculate the transverse scattering pattern. This method provides the exact solution to the transverse scattering without small angle approximation. This solution is generally applicable to any transverse wave scatterings on random rough surfaces and is not limited to small scattering angles. This paper together with PZ and LVS^{1} provide a complete solution for wave scattering on random rough surfaces in all directions. Examples are given for the Chandra Xray Observatory optics. This method is also useful for the next generation Xray astronomy missions.
 Publication:

EUV and Xray Optics: Synergy between Laboratory and Space IV
 Pub Date:
 May 2015
 DOI:
 10.1117/12.2180449
 Bibcode:
 2015SPIE.9510E..09Z