Terahertz characterization of electronic components and comparison of terahertz imaging with x-ray imaging techniques
Abstract
- Publication:
-
Terahertz Physics, Devices, and Systems IX: Advanced Applications in Industry and Defense
- Pub Date:
- May 2015
- DOI:
- 10.1117/12.2183128
- Bibcode:
- 2015SPIE.9483E..0KA