Dynamic intensity normalization using eigen flat fields in X-ray imaging Van Nieuwenhove, Vincent ; De Beenhouwer, Jan ; De Carlo, Francesco ; Mancini, Lucia ; Marone, Federica ; Sijbers, Jan Abstract Publication: Optics Express Pub Date: October 2015 DOI: 10.1364/OE.23.027975 Bibcode: 2015OExpr..2327975V