Spectroscopic ellipsometric modeling of a Bi-Te-Se write layer of an optical data storage device as guided by atomic force microscopy, scanning electron microscopy, and X-ray diffraction
Abstract
- Publication:
-
Thin Solid Films
- Pub Date:
- October 2014
- DOI:
- 10.1016/j.tsf.2014.08.026
- Bibcode:
- 2014TSF...569..124W