Brewster ``mode'' in highly doped semiconductor layers: an all-optical technique to monitor doping concentration Taliercio, Thierry ; Guilengui, Vilianne Ntsame ; Cerutti, Laurent ; Tournié, Eric ; Greffet, Jean-Jacques Abstract Publication: Optics Express Pub Date: October 2014 DOI: 10.1364/OE.22.024294 Bibcode: 2014OExpr..2224294T