Double-modulation reflection-type terahertz ellipsometer for measuring the thickness of a thin paint coating Iwata, Tetsuo ; Uemura, Hiroaki ; Mizutani, Yasuhiro ; Yasui, Takeshi Abstract Publication: Optics Express Pub Date: August 2014 DOI: 10.1364/OE.22.020595 Bibcode: 2014OExpr..2220595I