Determining the Electronic Performance Limitations in Top-Down-Fabricated Si Nanowires with Mean Widths Down to 4 nm Mirza, Muhammad M. ; MacLaren, Donald A. ; Samarelli, Antonio ; Holmes, Barry M. ; Zhou, Haiping ; Thoms, Stephen ; MacIntyre, Douglas ; Paul, Douglas J. Abstract Publication: Nano Letters Pub Date: November 2014 DOI: 10.1021/nl5015298 Bibcode: 2014NanoL..14.6056M