TFS: Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy Dahmen, Tim ; Baudoin, Jean-Pierre ; Lupini, Andrew R. ; Kübel, Christian ; Slusallek, Philipp ; de Jonge, Niels Abstract Publication: Microscopy and Microanalysis Pub Date: August 2014 DOI: 10.1017/S1431927614005650 Bibcode: 2014MiMic..20S.786D