Using Electron Channeling Contrast Imaging for Misfit Dislocation Characterization in Heteroepitaxial III-V/Si Thin Films
Abstract
- Publication:
-
Microscopy and Microanalysis
- Pub Date:
- August 2014
- DOI:
- 10.1017/S1431927614004486
- Bibcode:
- 2014MiMic..20S.552D