Predictive Hot-Carrier Modeling of n-Channel MOSFETs Bina, Markus ; Tyaginov, Stanislav ; Franco, Jacopo ; Rupp, Karl ; Wimmer, Yannick ; Osintsev, Dmitry ; Kaczer, Ben ; Grasser, Tibor Abstract Publication: IEEE Transactions on Electron Devices Pub Date: September 2014 DOI: 10.1109/TED.2014.2340575 Bibcode: 2014ITED...61.3103B