Optically Excited MOS-Capacitor for Recombination Lifetime Measurement Khorasani, Arash Elhami ; Schroder, Dieter K. ; Alford, T. L. Abstract Publication: IEEE Electron Device Letters Pub Date: October 2014 DOI: 10.1109/LED.2014.2345058 Bibcode: 2014IEDL...35..986K