Electroreflectance spectroscopy of compressively strained InGaN/GaN multi-quantum well structures Tawfik, Wael Z. ; Ryu, Han-Youl ; Lee, June Key Abstract Publication: Current Applied Physics Pub Date: November 2014 DOI: 10.1016/j.cap.2014.08.023 Bibcode: 2014CAP....14.1504T