Laboratory total reflection X-ray fluorescence analysis for low concentration samples
Abstract
Quantitative elemental determination for concentrations in the ppb range requires a careful preparation of the sample. In particular, for elemental analysis of very low concentration samples, less than 1 ng/mm2, a very bright X-ray source, typically synchrotron radiation (SR) in total external reflection fluorescence regime (SR-TXRF), is required. Here, we wish to demonstrate that a conventional source combined with a polycapillary semi-lens can provide a quasi-parallel beam intense enough for desktop TXRF analysis of low concentration samples.
- Publication:
-
Spectrochimica Acta - Part B: Atomic Spectroscopy
- Pub Date:
- November 2014
- DOI:
- 10.1016/j.sab.2014.07.020
- Bibcode:
- 2014AcSpB.101..114H
- Keywords:
-
- Polycapillary optics;
- X-ray fluorescence;
- Total external reflection;
- Low-concentration elemental analysis