Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection McCarthy, Aongus ; Krichel, Nils J. ; Gemmell, Nathan R. ; Ren, Ximing ; Tanner, Michael G. ; Dorenbos, Sander N. ; Zwiller, Val ; Hadfield, Robert H. ; Buller, Gerald S. Abstract Publication: Optics Express Pub Date: April 2013 DOI: 10.1364/OE.21.008904 Bibcode: 2013OExpr..21.8904M