Novel approaches in the SR beamline design
Abstract
High brightness third generation x-ray sources bring new experimental possibilities and impose new challenges. Coherent scattering and diffraction-limited microscopy require wave-preserving optics, high-resolution inelastic scattering novel optical elements, where x-ray interferometry or the requirements of precise polarization measurements change the optical layout. With NSLS-II development as an illustration we discuss recent trends in beamline design.
- Publication:
-
Nuclear Instruments and Methods in Physics Research A
- Pub Date:
- May 2013
- DOI:
- 10.1016/j.nima.2012.11.090
- Bibcode:
- 2013NIMPA.710..161K