Investigations on in situ diagnostics by an infrared camera to distinguish between the plasma facing tiles with carbonaceous surface layer and defect in the underneath junction

Both a deposition surface layer and a delamination underneath junction existing on plasma facing components (PFCs) can result in abnormal high surface temperature under normal heating conditions. The tile with delamination has to be replaced to prevent from a critical failure (complete delamination) during plasma operation while the carbon deposit can be removed without any repairing. Therefore, distinguishing in situ deposited tiles and junction defect tiles is crucial to avoid the critical failure without unwanted shutdown. In this paper, the thermal behaviors of junction defect tiles and carbon deposit tiles are simulated numerically. A modified time constant method is then introduced to analyze the thermal behaviors of deposited tiles and junction defect tiles. The feasibility of discrimination by analyzing the thermal behaviors of tiles is discussed and the requirements of this method for discrimination are described. Finally, the time resolution requirement of IR cameras to do the discrimination is mentioned.