X-ray diffraction from nonperiodic layered structures with correlations
Abstract
X-ray diffraction from films consisting of layers with different thicknesses, structures and chemical contents is analysed.
- Publication:
-
Acta Crystallographica Section A
- Pub Date:
- January 2012
- DOI:
- 10.1107/S0108767311044874
- Bibcode:
- 2012AcCrA..68..148K