Growth and optical properties of chromium borate thin films
Abstract
The present study focuses on the process of fabrication of chromium borate films using e-beam evaporation technique. The growth and optical properties of CrBO 3 thin films in the thickness range of 2-5 μm deposited by e-beam evaporation on to borosilicate glass substrates is reported for the first time. All films were deposited at ambient temperature using CrB 2 as the source material. Electron diffraction studies revealed the low-temperature growth of nanocrystalline CrBO 3 films. Raman and FT-IR spectra of the films exhibit signatures of three co-ordinated boron clearly signifying the formation of the borate. The spectral transmission of CrBO 3 films shows that films of the order of 2 micron are highly transparent (≈80%) in the visible region. The refractive index at 750 nm varies from 1.6 to 1.7 and the band gap is of the order of 2.4-2.8 eV. Nanoindentation measurements performed on the films indicate that the films are soft with hardness of the order of 0.5-1 GPa.
- Publication:
-
Solid State Sciences
- Pub Date:
- June 2011
- DOI:
- 10.1016/j.solidstatesciences.2011.04.002
- Bibcode:
- 2011SSSci..13.1334J