Electrostriction at the LaAlO3/SrTiO3 Interface
Abstract
We present a direct comparison between experimental data and ab initio calculations for the electrostrictive effect in the polar LaAlO3 layer grown on SrTiO3 substrates. From the structural data, a complete screening of the LaAlO3 dipole field is observed for film thicknesses between 6 and 20 uc. For thinner films, an expansion of the c axis of 2% matching the theoretical predictions for an electrostrictive effect is observed experimentally.
- Publication:
-
Physical Review Letters
- Pub Date:
- July 2011
- DOI:
- 10.1103/PhysRevLett.107.056102
- Bibcode:
- 2011PhRvL.107e6102C
- Keywords:
-
- 68.35.Ct;
- 61.05.C-;
- 71.15.Mb;
- 73.40.-c;
- Interface structure and roughness;
- X-ray diffraction and scattering;
- Density functional theory local density approximation gradient and other corrections;
- Electronic transport in interface structures