Materials Advances through Aberration-Corrected Electron Microscopy
Abstract
Over the last few years, the performance of electron microscopes has undergone a dramatic improvement, with achievable resolution having more than doubled. It is now possible to probe individual atomic sites in many materials and to determine atomic and electronic structure with single-atom sensitivity. This revolution has been enabled by the successful correction of the dominant aberrations present in electron lenses. In this review, the authors present a brief overview of these instrumental advances, emphasizing the new insights they provide to several areas of materials research.
- Publication:
-
MRS Bulletin
- Pub Date:
- January 2011
- DOI:
- 10.1557/mrs2006.4
- Bibcode:
- 2011MRSBu..31...36P
- Keywords:
-
- electron energy loss spectroscopy (EELS);
- scanning transmission electron microscopy (STEM);
- transmission electron microscopy (TEM)