The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction-Diffusion to Switching Oxide Traps
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- November 2011
- DOI:
- 10.1109/TED.2011.2164543
- Bibcode:
- 2011ITED...58.3652G