New directions in X-ray microscopy
Abstract
The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in X-ray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.
- Publication:
-
Contemporary Physics
- Pub Date:
- July 2011
- DOI:
- 10.1080/00107514.2011.589662
- Bibcode:
- 2011ConPh..52..293F
- Keywords:
-
- X-ray microscopy;
- X-ray diffraction;
- X-ray optics;
- phase-contrast