In this paper, the quasistatic dielectric constants of colloidal nanocrystals are investigated by Scanning Capacitance Microscopy/ Spectroscopy (SCM/SCS). Quasistatic C(V) curves are acquired on various nanocrystalline films (Fe3O4,CoFe2O4,PbS) with monolayer thickness and on uncovered reference areas on the same sample. Out of these data, the static dielectric constant is calculated using a simple parallel plate capacitor model. In addition, a systematic increase of the dielectric constants with decreasing frequency is found.
Physics of Semiconductors: 30th International Conference on the Physics of Semiconductors
- Pub Date:
- December 2011
- nanostructured materials;
- Nanocrystalline materials;
- Optical constants;
- Thin layers films monolayers membranes