Formation and Stability of 90 Degree Dislocation Cores in Ge Films on Si(001)
Abstract
The atomic structures and energetics of 90-degree dislocation cores in Ge films on Si(001) substrates are investigated using the first-principles density-functional calculations. To discuss the energetics of 90-degree dislocations, pairs of five- and seven-membered Ge rings are proposed as the core structure of 90-degree dislocation. The proposed core structure is found to be energetically stable with increasing Ge overlayers and we discuss the critical thickness of 90-degree dislocation.
- Publication:
-
Physics of Semiconductors: 30th International Conference on the Physics of Semiconductors
- Pub Date:
- December 2011
- DOI:
- 10.1063/1.3666317
- Bibcode:
- 2011AIPC.1399..185F
- Keywords:
-
- dislocations;
- electronic structure;
- finite difference methods;
- vacancies (crystal);
- 61.72.Lk;
- 71.23.Cq;
- 02.70.Bf;
- 61.72.jd;
- Linear defects: dislocations disclinations;
- Amorphous semiconductors metallic glasses glasses;
- Finite-difference methods;
- Vacancies