X-ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source
Abstract
Studies of materials on mesoscopic length-scales require a penetrating structural probe with submicron point-to-point spatial resolution. The principle research activities at beamline 34-ID-E of the Advanced Photon Source (APS) involve development of exciting new micro-/nano-diffraction techniques for characterization and microscopy in support of both applied engineering and fundamental materials research. Taking advantage of the high brightness of the source, advanced focusing mirrors, a novel depth profiling technique, and high-speed area detectors, three-dimensional scanning Laue diffraction microscopy provides detailed local structural information of crystalline materials, such as crystallographic orientation, orientation gradients, and strain tensors. It is general and applicable to single-crystal, polycrystalline, composite, deformed, and functionally graded materials. Applications include 3D diffraction investigations for a diverse and growing user community with interests in materials deformation, electro-migration, recrystallization, fatigue, solid-solution precipitation, high-pressure environments, and condensed matter physics.
- Publication:
-
10th International Conference on X-ray Microscopy
- Pub Date:
- September 2011
- DOI:
- 10.1063/1.3625316
- Bibcode:
- 2011AIPC.1365..108L
- Keywords:
-
- nanostructured materials;
- crystal orientation;
- electromigration;
- recrystallization;
- precipitation;
- 78.67.Bf;
- 81.10.Aj;
- 66.30.Qa;
- 81.10.Jt;
- 81.20.Fw;
- Nanocrystals and nanoparticles;
- Theory and models of crystal growth;
- physics of crystal growth crystal morphology and orientation;
- Electromigration;
- Growth from solid phases;
- Sol-gel processing precipitation