Electronic speckle pattern interferometry (ESPI) method is a wholefield, non destructive measurement method widely used in the industries such as detection of defects on metal bodies, detection of defects in intergrated circuits in digital electronics components and in the preservation of priceless artwork. In this research field, this method is widely used to develop algorithms and to develop a new laboratory setup for implementing the speckle pattern interferometry. In speckle interferometry, an optically rough test surface is illuminated with an expanded laser beam creating a laser speckle pattern in the space surrounding the illuminated region. The speckle pattern is optically mixed with a second coherent light field that is either another speckle pattern or a smooth light field. This produces an interferometric speckle pattern that will be detected by sensor to count the change of the speckle pattern due to force given. In this project, an experimental setup of ESPI is proposed to analyze a stainless steel plate using 632.8 nm (red) wavelength of lights.
Enabling Science and Nanotechnology: 2010 International Conference on Enabling Science And Nanotechnology Escinano2010
- Pub Date:
- May 2011
- displacement measurement;
- Speckle and moire patterns;
- Phase shifting interferometry;
- Spatial dimensions