PULSION® HP: Tunable, High Productivity Plasma Doping
Abstract
Plasma doping has been explored for many implant applications for over two decades and is now being used in semiconductor manufacturing for two applications: DRAM polysilicon counter-doping and contact doping. The PULSION HP is a new plasma doping tool developed by Ion Beam Services for high-volume production that enables customer control of the dominant mechanism—deposition, implant, or etch. The key features of this tool are a proprietary, remote RF plasma source that enables a high density plasma with low chamber pressure, resulting in a wide process space, and special chamber and wafer electrode designs that optimize doping uniformity.
- Publication:
-
American Institute of Physics Conference Series
- Pub Date:
- January 2011
- DOI:
- 10.1063/1.3548413
- Bibcode:
- 2011AIPC.1321..333F
- Keywords:
-
- doping profiles;
- plasma density;
- etching;
- atomic force microscopy;
- transmission electron microscopy;
- 81.70.Jb;
- 52.25.Dg;
- 81.65.Cf;
- 68.37.Ps;
- 68.37.Lp;
- Chemical composition analysis chemical depth and dopant profiling;
- Plasma kinetic equations;
- Surface cleaning etching patterning;
- Atomic force microscopy;
- Transmission electron microscopy