Extended depth-of-focus by digital holographic microscopy Colomb, Tristan ; Pavillon, Nicolas ; Kühn, Jonas ; Cuche, Etienne ; Depeursinge, Christian ; Emery, Yves Abstract Publication: Optics Letters Pub Date: June 2010 DOI: 10.1364/OL.35.001840 Bibcode: 2010OptL...35.1840C