Recovery of the MOSFET and Circuit Functionality After the Dielectric Breakdown of Ultrathin High-k Gate Stacks Crespo-Yepes, A. ; Martin-Martinez, J. ; Rothschild, A. ; Rodriguez, R. ; Nafria, M. ; Aymerich, X. Abstract Publication: IEEE Electron Device Letters Pub Date: June 2010 DOI: 10.1109/LED.2010.2045732 Bibcode: 2010IEDL...31..543C