Probing flare temperatures using AIA dispersion effects and RHESSI imaging/spectroscopy

Diffraction patterns that occur as a result of very intense, often saturated emission can provide many useful tools not ordinarily available. Specifically, analyzing dispersion features of high order diffraction patterns can provide useful insight into the thermal distributions of plasma within a structure. Here, we analyze the diffraction patterns of multiple SDO/AIA wavelength bands to more than 40 orders. Combining these results with imaging and spectroscopy from RHESSI enabled us to probe temperature and emission measure distributions within saturated flare sources.