Hyperspectral Imaging at the Micro- and Nanoscale using Energy-dispersive Spectroscopy (EDS) with Silicon Drift Detector (SDD) and EBSD Analysis
Abstract
SDD systems have become state of the art technology in the field of EDS. The main characteristic of the SDDs is their extremely high pulse load capacity of up to 750,000 counts per second at good energy resolution (<123 eV Mn-Kα, <46 eV C-Kα at 100,000 counts per seconds). These properties in conjunction with electron backscatter diffraction (EBSD) technique and modern data processing allows not only high speed mapping but also hyperspectral analysis. Here, a database is created that contains an EDS spectrum and/or EBSD pattern for each pixel of the SEM image setting the stage for innovative analysis options: The Maximum Pixel Spectrum function [1] synthesizes a spectrum out of the EDS database, consisting of the highest count level found in each spectrum channel. Here, (trace) elements which occur in only one pixel can be detected qualitatively. Areas of similar EDS composition can be made visible with Autophase, a spectroscopic phase detection system. In cases where the crystallographic phase assessment by EBSD is problematic due to pattern similarity, the EDS signal can be used as additional information for phase separation. This paper presents geoscience applications with the QUANTAX system with EDS SDD and EBSD detector using the options described above: (1) Drill core analysis of a Chicxulub impact ejecta sequence from the K/Pg boundary at ODP leg 207 [2] using fast, high resolution element maps. (2) Detection of monazite in granite by the Maximum Pixel Spectrum function. (3) Distribution of elements with overlapping peaks by deconvolution at the example of rare earth elements in zoned monazite. (4) Spectroscopic phase analysis of a sulfate-carbonate-dominated impact matrix at borehole UNAM-7 from the Chicxulub impact crater [3]. (5) EBSD studies with examples of iron meteorites and impact-induced, recrystallized carbonate melts [4]. In addition, continuing technological advances require the elemental analysis of increasingly smaller structures in many fields, including geosciences. It will be demonstrated that using low accelerating voltages, the element distribution of structures at the nanoscale in bulk samples can be displayed in a short time due to optimized signal processing and solid angle. Peaks composed of contributions from several overlapping elements e.g. N-K (392 eV) and Ti-Ll (395 eV) can be deconvolved [6] using an improved atomic database with 250 additional L, M and N lines below 4 keV. Improved light element quantification allows the standardless quantification of features at the nanoscale such as rutile grains 200-500 nm in size. References: [1] Bright D S. & Newbury D. E. (2004) Journal of Microscopy 216:186-193. [2] Schulte P. et al. (2010) Science 327: 1214-1218. [3] Salge T. (2007) PhD thesis: 130p. http://edoc.huberlin.de/docviews/abstract.php?lang=ger&id=27753. [4] Deutsch A. et al. MAPS 45: A45. [6] Tunckan O. (2010) Joining ceramics using capacitor discharge technique and determination of metal ceramic interface reactions, PhD thesis, Anadolu University, Eskisehir, Turkey. Acknowledgements: We thank P. Schulte, A. Deutsch, ODP, L. Hecht, A. Kearsley, J. Urrutria-Fucugauchi, O. Tunckan and S. Turan for generously providing the samples.
- Publication:
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AGU Fall Meeting Abstracts
- Pub Date:
- December 2010
- Bibcode:
- 2010AGUFM.V51C2214S
- Keywords:
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- 3625 MINERALOGY AND PETROLOGY / Petrography;
- microstructures;
- and textures;
- 3694 MINERALOGY AND PETROLOGY / Instruments and techniques;
- 3954 MINERAL PHYSICS / X-ray;
- neutron;
- and electron spectroscopy and diffraction;
- 9805 GENERAL OR MISCELLANEOUS / Instruments useful in three or more fields