We report the interplay between the anisotropic strain relaxation and the in-plane uniaxial magnetic anisotropy in a 5 nm Fe film grown on GaAs (0 0 1) by molecular-beam epitaxy. Tetragonal distortion and in-plane anisotropic strain relaxation were accurately measured by synchrotron X-ray diffraction. A stronger coherence at the interface between Fe and GaAs is also observed in the annealed film. A competing model including magnetocrystalline anisotropy, interface anisotropy, and magnetoelastic anisotropy is proposed to characterize the in-plane magnetic anisotropy.
Physica E Low-Dimensional Systems and Nanostructures
- Pub Date:
- December 2009
- Magnetic properties of thin films surfaces and interfaces;
- Thin film structure and morphology;
- X-ray diffraction and scattering