Electron affinity of arsenic and the fine structure of As- measured using infrared photodetachment threshold spectroscopy
Abstract
The binding energy and fine-structure splittings of the arsenic negative ion (As-) have been measured using infrared photodetachment threshold spectroscopy. The relative cross section for neutral atom production was measured with a crossed ion-beam-laser-beam apparatus over selected photon energy ranges between 630-810 meV. An s -wave threshold was observed due to the opening of the As-(4p4P32) to As(4p3S43/2) ground-state to ground-state transition, which yields the electron affinity of As to be 804.8(2) meV. s -wave thresholds were also observed for detachment from the J=1 and J=0 excited levels of As- , permitting accurate determination of the fine-structure splittings of 127.6(2) meV for P31-P32 and 164.3(10) meV for P30-P32 . The present values are consistent with previous measurements and substantially reduce the uncertainties.
- Publication:
-
Physical Review A
- Pub Date:
- July 2009
- DOI:
- 10.1103/PhysRevA.80.014501
- Bibcode:
- 2009PhRvA..80a4501W
- Keywords:
-
- 32.10.Hq;
- 32.80.Gc;
- Ionization potentials electron affinities;
- Photodetachment of atomic negative ions