Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy Gigler, Alexander M. ; Huber, Andreas J. ; Bauer, Michael ; Ziegler, Alexander ; Hillenbrand, Rainer ; Stark, Robert W. Abstract Publication: Optics Express Pub Date: December 2009 DOI: 10.1364/OE.17.022351 Bibcode: 2009OExpr..1722351G