The influence of Cu concentration on the transport and microstructure characteristics of Cu yZn 1-yCr 0.8Fe 1.2O 4 with 0.2≤ y≤1 ferrite was studied. X-ray, energy dispersive X- ray (EDAX) and infrared spectra (IR) were carried out to assure the formation of the sample in the proper form. The dielectric constant ( ∊') and ac conductivity were measured at different frequencies ranging from 600 kHz to 5 MHz from room temperature up to 800 K. The obtained data reveals that, a single phase cubic spinel structure for all the concentrations. From the results of IR spectra, mainly two bands were observed. The dielectric constant and the dielectric loss tangent decrease with increasing frequency and Cu concentration. The dielectric constant shows a dispersion peak ( ∊' max) which shifts to higher frequency with increasing the temperature. The results are explained as due to the fact that the dielectric polarization process is similar to that of conduction. The appearance of the dispersion peak is related to the contribution of two types of charge carriers.