Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching
Abstract
We demonstrate spectrally resolved photoluminescence quenching as a means to determine the exciton diffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by Förster transfer, whereas triplet diffusion occurs primarily via Dexter transfer.
- Publication:
-
Journal of Applied Physics
- Pub Date:
- March 2009
- DOI:
- 10.1063/1.3079797
- Bibcode:
- 2009JAP...105e3711L
- Keywords:
-
- 71.35.-y;
- 78.66.Qn;
- 78.55.Kz;
- 81.05.Hd;
- 68.55.J-;
- Excitons and related phenomena;
- Polymers;
- organic compounds;
- Solid organic materials;
- Other semiconductors;
- Morphology of films