Localization and characterization of simple defects in finite-sized photonic crystals

Structured materials like photonic crystals require for optimal use a high precision both on position and optical characteristics of the components which they are made of. Here, we present a simple tomographic algorithm, based on a specific Green's function together with a first-order Born approximation, which enables us to localize and characterize identical defects in finite-size photonic crystals. This algorithm is proposed as a first step to the monitoring of such materials. Illustrative numerical results show in particular some possibility of focalization beyond the Rayleigh criterion.